Login | Register | Àå¹Ù±¸´Ï | Sitemap | Contact us
ÇØ¿ÜÀâÁö > Àü±â/ÀüÀÚ
È­Çкоß
°íºÐÀÚ/Á¢Âø
ÇÁ¶ó½ºÆ½/°í¹«
¼¶À¯
µµÀå/µµ·á
¼¼¶ó¹Í
Á¦Áö/ÆÞÇÁ
¿¡³ÊÁö/¼®À¯È­ÇÐ
½ÄÇ°°ø¾÷
±â°èÀϹÝ
±Ý¼Ó/ö°­
Àç·á
Àü±â/ÀüÀÚ
ÄÄÇ»ÅÍ
°ÇÃà/¼³ºñ
Åä¸ñ
Á¦¾à
ÀÇÇÐ
È­ÀåÇ°
³ó¾÷/¼ö»ê/Ãà»ê/ÀÓ¾÷
Ãֽżø      ¾ËÆĺª¼ø
MICROELECTRONICS AND RELIABILITY.
¹ßÇà»ç : Pergamon Press ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
MICROELECTRONIC ENGINEERING.
¹ßÇà»ç : Elsevier Science Publishers BV ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
KEY ABSTRACTS. COMPUTING IN ELECTRONICS AND POWER.
¹ßÇà»ç : Institution of Electrical Engineers ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF SUPERCONDUCTIVITY.
¹ßÇà»ç : Plenum Press ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF PLASMA PHYSICS.
¹ßÇà»ç : Cambridge University Press ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
THE JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY
¹ßÇà»ç : International Microwave Power Institute ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF MATERIALS SCIENCE. MATERIALS IN ELECTRONICS.
¹ßÇà»ç : Chapman & Hall ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF ELECTRONICS MANUFACTURING.
¹ßÇà»ç : Chapman & Hall ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF ELECTRONIC TESTING : THEORY AND APPLICATIONS
¹ßÇà»ç : Kluwer Academic Publishers ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF ELECTRONIC MATERIALS.
¹ßÇà»ç : Minerals, Metals and Materials Society ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF ELECTRONIC IMAGING.
¹ßÇà»ç : International Society for Optical Engineering ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JOURNAL OF COMMUNICATIONS TECHNOLOGY & ELECTRONICS.
¹ßÇà»ç : Scripta Technica ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
JEI, JOURNAL OF THE ELECTRONICS INDUSTRY.
¹ßÇà»ç : Dempa Publications Inc. ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING.
¹ßÇà»ç : John Wiley & Sons Ltd. ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTERNATIONAL JOURNAL OF HIGH SPEED ELECTRONICS.
¹ßÇà»ç : World Scientific Publishing Company ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS.
¹ßÇà»ç : John Wiley & Sons Ltd. ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTERNATIONAL JOURNAL OF ACTIVE CONTROL.
¹ßÇà»ç : Multi Science Publishing Company Ltd. ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTEGRATION, THE VLSI JOURNAL.
¹ßÇà»ç : Elsevier Science Publishers BV ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTEGRATED FERROELECTRICS.
¹ßÇà»ç : Gordon & Breach Science Publishers, Inc. ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
INTEGRATED CIRCUITS INTERNATIONAL.
¹ßÇà»ç : Elsevier Advanced Technology ¹ßÇà±¹°¡ :
°£ º° :
°¡°Ý :  
 1  2  3  4  5  6  7  8  9  10  ´ÙÀ½
ÁÖ¼Ò : ¼­¿ïƯº°½Ã ¿µµîÆ÷±¸ ¿©Àǵµµ¿ 53-1
¼­¿ï¿Ü¼­ | »ç¾÷ÀÚµî·Ï¹øÈ£ : 116-98-05758 | ´ëÇ¥ÀÚ : Á¤°æÀÏ
Åë½ÅÆǸž÷½Å°í¹øÈ£:2012-¼­¿ï¿µµîÆ÷-0791È£
TEL : (02)780-1094 | FAX : (02)784-3980 | e-mail : booklink@booklink.co.kr

Copyright (C) Booklink All Rights Reserved.